Areas of applications: nondestructive testing of residual and technological
stresses in optical elements via 2D mapping of optical phase retardation
and orientation of optical indicatrix
Technical specifications:
Tolerance in the measurement of:
optical indicatrix orientation (depending on
the phase retardation value):
~1 deg (30-160 deg);
~5 deg (5-30 and 160-175 deg);
1. Quality control for quaterwave plates Coordinate dependencies of the phase retardation
and optical indicatrix orientation along a diameter of quaterwave plates
of different quality.
2. Control of assembling quality for an active element of a solid
state laser.
Assembling of laser active element can be
accompanied by mechanical stresses, affecting optical characteristics of
the optical elements and worsening the laser generation
Distribution of optical phase retardation, induced
in the active element by its squeezing at the installation of a laser cavity
(input and output surfaces)
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