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Studies of Raman Scattering from Bi12GeO20 Crystal-Copper
Film Interface
Moiseyenko V., Vdovin A.
Dniepropetrovsk National University, 13 Naukova St., 49050
Dniepropetrovsk, Ukraine
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Depolarized Raman spectra have been measured in the geometry of back-scattering
from the front surface of Bi12GeO20, the bulk of this crystal and the interface
Bi12GeO20-copper film. The characteristics of Raman spectra for the Bi12GeO20
crystal-copper film interface have been determined and compared with those
of the crystal volume. It is assumed that the oscillator parameters of
the surface vibration on Bi12GeO20 crystal-copper film interface represent
a result of plasmon-phonon inter-actions, as well as influence of defects
in the frontier layer broken by mechanical polishing. The amplification
coefficient of the Raman scattering on surface vibrations has been estimated.
Key words: surface enhanced Raman scattering (SERS), island copper
film, cross-section of Raman scattering, phonon modes.
PACS: 78.30.Hv, 78.68.+m
doi 10.3116/16091833/7/2/74/2006 |
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doi:10.1063/1.438368
http://dx.doi.org/10.1063/1.438368 |