Ukrainian Journal of Physical Optics 

Number  3, Volume 4,  2003

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Optical-Refractometric Synthesis of Transmission Spectra and Optical Parameters of 0.5TiO2*0.5Nd2O3 Thin Films
1Studenyak I.P., 2,3Kranjcec M., 1Nahusko O.T., 4Borets O.M.

1Uzhhorod National University, 46 Pidhirna Str., Uzhhorod 88000, Ukraine
2University of Zagreb, Geotechnical Department Varaždin, 7 Hallerova Aleja, 42000 Varaždin, Republic of Croatia
3Ruder Boskovic Institute, 54 Bijenicka Cesta, 10000 Zagreb, Republic of Croatia
4Department of Institute of Information Recording Problems, Ukr. Nat. Acad. Sci., P. O. Box 47c, Uzhhorod 88000, Ukraine

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An original method for determining the optical parameters of thin films with the optical-refractometric synthesis of their transmission spectra is suggested. The proper choice of dispersion relation for refractive indices is substantiated. Experimental studies and computer simulations are performed for the quartz-glass optical element with 0.5TiO2*0.5Nd2O3 film. The advantages of the suggested method are discussed.

Key words: thin film, transmission spectra, optical-refractometric synthesis, optical constants.
PACS: 78.20.Ci, 78.66.Nk

doi 10.3116/16091833/4/3/139/2003

1. Rozenberg GV, Optics of Thin-Layer Coatings. Fiz. Mat. Lit. (1958), 572 p. (in Russian)
2. Shewchun J and Rowe EC, 1970. J. Appl. Phys. 41: 4128-4138.
3. Dobrowolski IA, Ho FC and Waldort A, 1983. Appl. Optics 22: 3191-3200.
4. Pshenitsyn VI, Abaev MI and Lyzlov NYu, 1986. Ellipsometry in Physical and Chemical Studies. Khimiya.
5. Ioffe BV, 1983. Refractometric Methods of Chemistry. Khimiya.
6. Batsanov SS, 1976. Structural Refractometry. Vysshaya Shkola.
7. Wemple SH and DiDomenico M, 1971. Phys. Rev. B 3: 1338-1352.
8. Wemple SH, 1973. Phys. Rev. B 7: 3767-3777.
9. Borets AN, 1980. Ukr. Fiz. Zh. 25: 680-682.
10. Borets AN, 1983. Ukr. Fiz. Zh. 28: 1346-1350.
11. Studenyak IP, Suslikov LM, Kovacs GySh, Kranjcec M and Tovt VV, 2001. Opt. i Spectroskop. 90: 608-611.
12. Studenyak IP, Kranjcec M, Mykailo OA, Bilanchuk VV, Panko VV and Tovt VV, 2001. J. Optoelectronics and Advanced Materials 3: 879-884.
13. Moss TS, 1985. Phys. Stat. Sol. (b) 131: 415-427.
14. Havens OS, 1967. Measurements of Optical Constants of Thin Films. Mir.
15. Berning PH, 1967. Theory and Methods for Optical Properties Calculations of Thin Films. Mir .

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