|
1. Singh NB, Suhre DR, Balakrisha V, Marable M, Fernelius N, Hopkins FK and Zelmon D, 1998. Progr. Cryst. Growth Charact. Mater. 37: 47-102. doi:10.1016/S0960-8974(98)00013-8 http://dx.doi.org/10.1016/S0960-8974(98)00013-8 2. Savchyn VP and Kytsai VB, 2000. Thin Solid Films 361-362: 123-125. doi:10.1016/S0040-6090(99)00796-8 http://dx.doi.org/10.1016/S0040-6090(99)00796-8 3. Stakhira J, Savchyn V and Kytsay V, 1999. Molec. Phys. Rep. 23: 184-186. 4. Berchenko NN, Balitskii OA, Lutsiv RV, Savchyn VP and Vasyltsiv VI, 1997. Mater. Chem. Phys. 51: 125-129. doi:10.1016/S0254-0584(97)80280-5 http://dx.doi.org/10.1016/S0254-0584(97)80280-5 5. Savchyn VP and Stakhira JM, 1996. Phys. Status Solidi (a) 156: 113-118. 6. Iwakuro H, Tatsuyama C and Ichimura S, 1982. Jpn. J. Appl. Phys. 21: 94-99. doi:10.1143/JJAP.21.94 http://dx.doi.org/10.1143/JJAP.21.94 7. Kong LB, Zhu W and Tan OK, 2000. Mater. Lett. 42: 232-239. doi:10.1016/S0167-577X(99)00190-1 http://dx.doi.org/10.1016/S0167-577X(99)00190-1 8. Thurmond CD, Shwartz GP, Kammlott GW and Shwartz BJ, 1980. Electrochem. Soc. 127: 1366-1371. doi:10.1149/1.2129900 http://dx.doi.org/10.1149/1.2129900 9. Aleshenko YuA, Berchenko NN, Vinnikova AI, Vodopyanov LK, Matveenko AV, Medvedev YuV and Tretyakova EA, 1989. Sov. Phys. Tech. Lett. 15: 17-20. 10. Kuroda N, Ueno O and Nishina Y, 1987. Phys. Rev. B35: 3860-3870. 11. Kojima N, Yamada A, Takahashi K, Okamoto T, Konagai M and Saito K, 1993. Jpn. J. Appl. Phys. 32: L887-L889. doi:10.1143/JJAP.32.L887 http://dx.doi.org/10.1143/JJAP.32.L887 12. Ohmura K, Aoki N and Snakayama T, 2000. J. Phys. Soc. Jpn. 69: 3860-3863. doi:10.1143/JPSJ.69.3860 http://dx.doi.org/10.1143/JPSJ.69.3860 13. Chen P, Zhang R, Xu XF, Zhou YG, Chen ZZ, Xie SY, Li WP and Zheng YD, 2000. Appl. Phys. A71: 191-194. 14. Dohy D and Lucazeau G, 1982. J. Molec. Struct. 79: 419-422. doi:10.1016/0022-2860(82)85094-1 http://dx.doi.org/10.1016/0022-2860(82)85094-1 15. Dohy D, Lucazeau G and Revcolevschi A, 1982. J. Sol. State Chem. 45: 180-192. doi:10.1016/0022-4596(82)90274-2 http://dx.doi.org/10.1016/0022-4596(82)90274-2 |