Ukrainian Journal of Physical Optics 

Number  1, Volume  2, March  2001

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Investigation of the adsorption behavior of polymethacrylic acid on silicon substrates 

1,2Kostruba A.M., 1Fedorko V.F., 1Skorobogaty Ya.P., 1Korodenko G.D.

1 Lviv academy of commerce, 9 Samtshuk Str., 79011, Lviv, Ukraine
2 Institute of physical optics, 23 Dragomanov Str., 79005, Lviv, Ukraine

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Thickness and optical parameters of the adsorption polymer layers of polymethacrylic acid (PMAA) from water solution was investigated. Null-ellipsometry technique is used for in-situ determination of the adsorbed layer parameters. Two calculation methods are used for solving of the inverse ellipsometry problem for the suggested two-layer model of the surface. Adsorbed amount in the equilibrium state of the layers is calculated for the polymers with different molecular characteristics and corresponding adsorption isotherms are obtained.

Key words: ellipsometry, adsorption, polymethacrylic acid, surface layers

doi 10.3116/16091833/2/1/21/2001
References
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