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Physical properties and band structure parameters of solid solutions Hg1-x-yMgxMnyTe
Frasunyak V.M., Gorley P.M., Chupyra S.M.

Yuri Fedkovych Chernivtsi National University, 2 Kotsyubynsky St., 58012 Chernivtsi, Ukraine

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We present the results of mechanical, electrical, optical and magnetic characterizations of quaternary solid solutions Hg1-x-yMgxMnyTe for the temperature range of 77300 K. It is shown that introduction of Mn and Mg atoms into the crystalline lattice of HgTe increases microhardness of the alloy. Optimal thermal treatment procedures in the constituent vapours are determined, enabling to control the concentration of active defects and, consecutively, to obtain the materials with different conductivity types and predictable concentrations of carriers. Functional dependences of the band gap and the intrinsic carrier concentration for Hg1-x-yMgxMnyTe on the composition and temperature are obtained.

Keywords: solid solutions, absorption spectra, microhardness, band structure

PACS: 75.40.Cx, 72.80.Ey, 78.40.Fy
UDC: 535.34
Ukr. J. Phys. Opt. 9 27-33 
doi: 10.3116/16091833/9/1/27/2008
Received: 23.11.2007

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